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Q67040-S4231 Datasheet(PDF) 9 Page - Infineon Technologies AG |
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Q67040-S4231 Datasheet(HTML) 9 Page - Infineon Technologies AG |
9 / 15 page SKP06N60, SKB06N60 SKA06N60 9Jul-02 50A/ µs 150A/µs250A/µs350A/µs 450A/µs 550A/µs 0ns 100ns 200ns 300ns 400ns 500ns I F = 3A I F = 6A I F = 12A 50A/ µs150A/µs 250A/µs 350A/µs 450A/µs 550A/µs 0nC 200nC 400nC 600nC 800nC 1000nC I F = 3A I F = 6A I F = 12A diF/dt, DIODE CURRENT SLOPE diF/dt, DIODE CURRENT SLOPE Figure 20. Typical reverse recovery time as a function of diode current slope (VR = 200V, Tj = 125 °C, Dynamic test circuit in Figure E) Figure 21. Typical reverse recovery charge as a function of diode current slope (VR = 200V, Tj = 125 °C, Dynamic test circuit in Figure E) 50A/ µs 150A/µs 250A/µs 350A/µs 450A/µs 550A/µs 0A 2A 4A 6A 8A 10A 12A I F = 3A I F = 12A I F = 6A 50A/ µs 150A/µs 250A/µs 350A/µs 450A/µs 550A/µs 0A/ µs 100A/ µs 200A/ µs 300A/ µs 400A/ µs 500A/ µs 600A/ µs diF/dt, DIODE CURRENT SLOPE diF/dt, DIODE CURRENT SLOPE Figure 22. Typical reverse recovery current as a function of diode current slope (VR = 200V, Tj = 125 °C, Dynamic test circuit in Figure E) Figure 23. Typical diode peak rate of fall of reverse recovery current as a function of diode current slope (VR = 200V, Tj = 125 °C, Dynamic test circuit in Figure E) |
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