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AT29C512-70TU Datasheet(PDF) 5 Page - ATMEL Corporation |
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AT29C512-70TU Datasheet(HTML) 5 Page - ATMEL Corporation |
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5 / 18 page  5 0456H–FLASH–2/05 AT29C512 4.7 DATA Polling The AT29C512 features DATA polling to indicate the end of a program cycle. During a program cycle an attempted read of the last byte loaded will result in the complement of the loaded data on I/O7. Once the program cycle has been completed, true data is valid on all outputs and the next cycle may begin. DATA polling may begin at any time during the program cycle. 4.8 Toggle Bit In addition to DATA polling the AT29C512 provides another method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the device will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time during a program cycle. 4.9 Optional Chip Erase Mode The entire device can be erased by using a 6-byte software code. Please see Software Chip Erase application note for details. 5. Absolute Maximum Ratings* Temperature Under Bias................................ -55 °C to +125°C *NOTICE: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent dam- age to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Storage Temperature ..................................... -65 °C to +150°C All Input Voltages (including NC Pins) with Respect to Ground ...................................-0.6V to +6.25V All Output Voltages with Respect to Ground .............................-0.6V to VCC + 0.6V Voltage on OE with Respect to Ground ...................................-0.6V to +13.5V |
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